Crystal structure and morphology are confirmed by XRD.
利用XRD证明了晶体结构及形态。
The structure and morphology ofthe coating film are studied by use of SEM andpolarized microscope.
用扫描电子显微镜及偏光显微镜观察涂膜的结构及形态。
The spectral characteristic of the materials can indicate its component, structure and morphology.
材料的光谱特性能够直接反映材料的组成、结构和形态特征。
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