In many issues of the reliability of copper interconnection, we place the emphasis on electromigration and stress migration.
在铜互连可靠性的几个主要问题中,重点针对互连中的电迁徙和应力迁徙进行了探讨。
参考来源 - ULSI中铜互连线可靠性的研究·2,447,543篇论文数据,部分数据来源于NoteExpress
以上来源于: WordNet
The stress migration is one of defect that determines metal routing reliability in the IC manufacture.
应力迁移是影响集成电路(IC)金属配线可靠性的缺陷之一。
The antioxidants apparently help the birds deal with the stress of migration.
抗氧化剂显然帮助鸟类度过迁移的压力。
Stress is an important part in oil exploration because it affects the oil migration and the location where oil exists.
应力是油田勘探中不可缺少的部分,因为它影响着油气运移,决定油气的成藏位置。
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