The steady state thermal resistance has important influence on the life test by researching the discrete semiconductor devices.
在进行相关分立器件分析时发现，稳态热阻对功率器件寿命试验结果影响较大。
This paper suggests that the change of the steady state thermal resistance should become one of the criterions of the life test.
通过相关案例分析，提出稳态热阻的变化量应作为功率器件寿命试验合格判据之一的建议。
The influences of epaxial light intensity and energy distribution in far field caused by steady-state thermal blooming with wind are calculated and analysed.
采用数值模拟的方法，研究了强激光在大气传输过程中产生的稳态热晕效应。
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