With the increase of the implantation voltage, the root-mean-square roughness (RMS) of Zr films almost don't change.
随着注入高压的增加，薄膜的表面粗糙度均方根（RMS）值的变化不大。
Multiple scattering from two-dimensional rough surface with large surface root mean square(RMS) slope is studied with Kirchhoff approximation.
利用基尔霍夫近似研究了表面均方根斜率较大的二维粗糙面的多次散射问题。
Stabilization is achieved by adopting an amplitude stabilizer. The root mean square (RMS) of energy output is lowered from about 4% to below 1%.
采用稳幅器件有效地提高了输出能量的稳定性，放大前级的输出能量波动的均方根值从4%左右降到1%以下。
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