Reading span test score (RST) is a measure of the important indicators of working memory capacity.
阅读广度测验成绩(RST)是衡量工作记忆容量的重要指标。
The paper mainly dwells on the common failure modes and the IC accelerating life span test theory and technology.
本文主要论述集成电路加速寿命测试理论方法和IC常见失效模式。
CONCLUSION: It is feasible to change the digit span test in Wechsler Intelligence Scale from individual test to group test.
结论：改变韦氏智力测验中的数字广度的测验方法，把该个别测验作为团体测验使用是可行的。
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