This paper presents the TAM optimization and test scheduling algorithm for multi-clock SOC, and it aims at decreasing test time of multi-clock SOC.
该文提出了用于多时钟域soc的TAM优化与测试调度算法,以减少多时钟域soc的测试时间。
Experimental results for two ITC '02 SOC benchmark show that the pair balance-based test scheduling achieves less test time compared to the previous approaches.
在ITC ' 02基准电路上的实验结果验证了基于对平衡测试调度算法的有效性。
A deterministic algorithm is proposed for System-on-Chip (SOC) test scheduling.
提出了一种确定性的片上系统(SOC)测试调度算法。
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