...ynq应用于星载计算机所存在的核心问题是如何在空间复杂的高能粒子辐射环境中保证其器件的可靠性,单粒子翻转(Single Event Upset,SEU)是Zynq所面临的主要的可靠性问题。
基于4个网页-相关网页
SRAM Single event upset SRAM单粒子翻转
Single Event Upset rate 单粒子翻转率
single event upset SEU 单粒子翻转
single event multiple bit upset 单粒子多位翻转
single upset event 单粒子效应
Current Field Programmable Gate Array(FPGA) chip can only be erased and configured periodically and repeatedly during the Single Event Upset(SEU) error detection, and this is not a continuous error detection and correction method.
现有的现场可编程门阵列(FPGA)芯片在进行单粒子翻转(SEU)检错时，只能针对FPGA配置单元进行周期性重复擦写而不能连续检错纠错。
参考来源 - 一种SEU硬核检测电路的设计与实现·2,447,543篇论文数据，部分数据来源于NoteExpress
以上来源于: WordNet
The incident Angle dependences of the cross sections for single event upset and single event latchup are presented.
获得了单粒子翻转和单粒子闭锁截面与入射角度的依赖关系。
Feasibility of prediction for single event upset rate based on 252cf experimental results in space orbits was analyzed.
在实验研究的基础上，分析了应用锎源实验结果预估空间轨道单粒子翻转率的可行性。
Two typical master-slave type D flip-flop of strong hardness to Single Event Upset(SEU) for radiation environment are introduced.
介绍了两种已有的主从型边沿D触发器，它们具有很强的抗单粒子翻转能力。
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