silicon single crystal rod 单晶硅棒
Standard Silicon Single Crystal Wafer 标准硅单晶晶片
mm silicon single crystal mm硅单晶
p-type high-resistance silicon single-crystal p型高阻硅单晶
single crystal silicon 晶硅棒 ; 材料单晶硅
CZ silicon single crystal 直拉硅单晶
The reference parameter values are determined from the growth of a reference silicon single crystal.
从参考硅单晶的生长来确定参考参数的数值。
The behavior of oxidation-induced stacking faults (OSF) in NCZ and CZ silicon single crystal was investigated.
采用直拉法生长普通和掺氮硅单晶，研究不同含氮浓度的晶体中氧化诱生层错（OSF）的行为。
The deep levels in electron irradiated CZ silicon single crystal grown in pure nitrogen protective atmosphere has been studied.
本文研究了电子辐照在氮保护气氛中生长的直拉硅单晶中引入的深能级。
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