A novel approach based on genetic algorithms is proposed to generate the effective and efficient test strategy for sequential fault diagnosis.
针对序贯故障诊断问题，提出一种基于遗传算法的诊断测试策略生成方法。
Base on the existing synchronous sequential circuits fault simulator-HOPE, the test vector generation method of sequential circuits based on ant algorithm is systematically researched firstly.
本文在同步时序电路故障模拟器—HOPE的基础上，率先对基于蚂蚁算法的时序电路测试矢量生成方法作了系统的开拓性研究。
This paper presents a multiple fault test simulator for sequential logic circuit. The simulator is implemented in serial-parallel to save memory.
本文给出一个时序逻辑电路的多故障测试模拟程序。
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