... semiconductor on sapphire device 蓝宝石上半导体掐 semiconductor noise 半导体噪声 semiconductor microprocessor 半导体微措置奖惩奖惩机 ...
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laser noise of semiconductor 半导体雷射噪声
semiconductor devices noise 电子器件的噪声
noise of semiconductor 半导体噪声
It is found that the amplitude distribution of nai-row band semiconductor noise agrees with that of the normal law distribution.
测量结果证明窄频带晶体三极管噪声的振幅分布，和遵守正态律的振幅分布相符合。
The amplitude distribution of narrow hand semiconductor noise in junction type OC70, OC71 and point contact type 2N32A transistors were measured experimentally by the "maximum amplitude" method.
本文中描述用振幅峰值的方法，测量面接触型晶体管OC70，OC71和点接触型晶体管2N32A内窄频带低频率噪声的振幅分布。
The noise components estimation of semiconductors is the precondition of reliability screening of semiconductor devices using noise measurement.
半导体的噪声成分估计是利用噪声进行器件可靠性筛选的前提条件。
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