This is a semiconductor integrated circuit.
这是一个半导体集成电路。
The present invention provides a semiconductor integrated circuit having internal voltage generating circuit.
本发明提供了一种具有内部电压发生电路的半导体集成电路。
The invention relates to a defect analysis method for semiconductor integrated circuit devices and a defect analysis system.
本申请涉及用于半导体集成电路设备的缺陷分析方法和缺陷分析系统。
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