The subject of analysis and inspection of semiconductor optoelectronic film is one of the most important problems for device development.
半导体光电薄膜的分析和检测是器件开发中必须首先要解决的重要问题之一。
Semiconductor device, semiconductor wafer, chip size package, and methods of manufacturing and inspection therefor.
半导体器件，半导体晶片，芯片尺寸封装及制作和检测方法。
Cross semiconductor laser and CCD camera are used to set up a vision inspection system in this paper.
本文使用十字线激光器，配置CCD相机组成十字线结构光视觉测量系统。
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