formula Scherrer Scherrer公式
With the increase of the substrate temperature, the preferential orientation of doped films was enhanced and the FWHM decreased, while the grains became larger estimated according to the Scherrer formula.
随着衬底温度的升高,掺杂薄膜的C轴择优取向性增强,衍射峰半高宽逐渐下降,通过谢乐公式计算发现,晶粒尺寸增大。
参考来源 - 雾化法制备硫化镉薄膜及其掺杂特性研究·2,447,543篇论文数据,部分数据来源于NoteExpress
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