The results indicate that scatter intensity is dependent on surface veins and optical properties of coatings.
结果表明，散射强度与表面纹理结构、涂层材料的光学性质有关。
Resonance light scattering spectrometry of PAR is analyzed; the formation and influential factors of scatter intensity are probed.
详细研究了PAR共振散射光谱，初步探索了其形成原因和散射强度的影响因素。
Finally, after extracting and adjusting the spot and background intensity information, data preprocessing is carried out by using the scatter plot and the ma plot.
最后，在数据提取方面，对基因芯片图像的靶点信号强度与背景信号强度进行了提取与校正，并且运用散点图与MA图对数据进行了预处理。
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