In this paper, scanning tunneling microscopy (STM) is used to investigate the microstructure of organic films in optical recording.
运用扫描隧道显微镜(STM)观察了光记录有机薄膜的微观结构。
Various types of probes which are installed to the small three dimensional profile measuring apparatus based on principle of scanning tunneling microscopy (STM) are fabricated by the proposed method.
用这种方法制造了多种探头，将其装在基于扫瞄隧道显微技术(STM)的小型三维轮廓测量仪上。
Atomic force microscope (AFM) was invented as another nanoscale microscopy with high resolution based on scanning tunneling microscope (STM) and has extensive application in polymer field.
原子力显微镜(afm)是在扫描隧道显微镜(STM)基础上发明的又一种纳米级高分辨率显微技术，目前已在高分子领域获得了广泛的应用。
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