The scanning electron microscope provides information on chemical composition by use of X-ray spectrometer attachments.
扫描电子显微镜能利用x射线谱仪的附件来提供化学组份的信息。
The microstructure of multilayers was characterized by high-resolution transmission electron microscopy, X-ray diffraction, scanning electron microscope and energy dispersive spectrometer.
利用透射电子显微镜、X射线衍射仪、扫描电子显微镜和X射线能量色散谱仪分析了多层膜的微结构。
A novel micro infrared spectrometer was designed which is different from traditional grating scanning one.
设计了一种不同于传统光栅扫描型光谱仪的新型微小型红外光谱仪。
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