Electrochemical scanning probe microscopes (ECSPM) have become one of the most powerful techniques for studies of solid liquid interfaces.

电化学扫描探针显微镜(ECSPM)已成为研究固-液界面结构的有力的工具。

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Several quantitative drift measurement techniques for scanning probe microscopy (SPM) were introduced. A new method using two-dimensional zero-reference masks was proposed to measure the SPM drift.

对扫描探针显微镜(SPM)仪器漂移的定量测量的几种方法进行探讨，提出应用二维零位标记进行漂移测量。

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