This paper proposes a learning control based high-speed scanning mode for an AFM system.
本文针对原子力显微镜系统，提出了一种基于学习控制的快速扫描模式。
From the view of the whole ct system, the scanning mode and hardware are reviewed. And on the specific technology detail, two aspects are described.
从总体角度对系统的扫描方式及硬件的进展进行了回顾，在具体技术细节上主要从两个方面对CT成像技术的进展展开阐述。
Various scanning mode is built in the system, which offers system-level support for the most common scan mode, and users can define pattern as they like.
系统内置了丰富多样的扫描方式，对于霓虹灯的一些常见动态效果都提供了系统级的支持，而且允许用户自定义花样。
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