It is demonstrated that the detection sensitivity can be greatly improved, and the resolution of SFM (scanning force microscopy) image can reach nanometer order of magnitude.
实验结果表明，检测灵敏度大大提高，扫描力显微(SFM)像的分辨率可达纳米量级。
In this thesis, Scanning Force Microscopy (SFM) was used to study the nanoscale electric phenomena of the surface and interface properties of ferroelectric thin films.
本论文利用扫描力显微镜研究了铁电薄膜表面与界面的电势及电畴等微区性质。
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