With the help of scanning electronic microscope (SEM), the same conclusion is proved by the interfacial state and morphological structure of the composites.
应用扫描电子显微镜(SEM)，分别对不同复合材料进行了界面形态的观察，证明与试验结果一致。
The samples were characterized by X-ray diffraction (XRD), Scanning electronic microscope (SEM), photoluminescence (PL) and X-ray excited luminescence (XEL) spectra.
分别以X-射线衍射（XRD）、扫描电子显微镜（SEM）、光致发光（PL）光谱及X-射线激发的发光（XEL）光谱对样品进行了表征。
By scanning electronic microscope (SEM) it was tested for the interfacial state and morphological structure of different composites.
应用扫描电子显微镜(SEM)分别对不同复合材料进行了界面形态和微观结构的研究。
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