point-by-point scaning [计] 逐点扫描
Scaning Laser ophthalmoscope 扫描激光检眼镜
Scaning electronics microscopy (SEM) was applied hereby to surface phase and elements analysis of the powder by precursor method and grain sample by microwave method.
用扫描电子显微镜(SEM)对粉料及微波合成的块体样品表面进行物相分析和元素的半定量分析。
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