Boundary Scan Testing 边界扫描测试 ; 和边界扫描测试技术 ; 边界扫描法
Path Scan Testing 通路扫描法
ultrasonic c-scan testing 超声c扫描成像
SRAM BIST is also combined with ARM core's boundary scan testing during system level DFT.
系统级可测性设计主要是将存储器BIST与ARM核的边界扫描测试相结合。
The delay in the scan path reduces the need for external buffers to avoid hold-time violations during scan testing of integrated circuits.
该扫描路径上的延迟减少对外部缓冲器的需求,进而在集成电路扫描测试时避免保持时间违反。
Many in-circuit testers now have boundary-scan test capability. With boundary-scan testing, you can test interconnections on PCBs without using a probe on each node.
很多测试设备具有分界扫描的功能,这样,测试人员就可以直接测试印刷电路板上的互连,而没用必要使用探针去测试每一个节点了。
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