A pattern generator coupled to the single memory manipulates the parallel test vectors used during the parallel test mode and the parallel and scan test vectors used during the scan test mode.
耦合到单个存储器的模式发生器操纵在并行测试方式过程中使用的并行测试矢量和在扫描测试方式过程中使用的并行和扫描测试矢量。
The principles and features of raster scan, the function of the pattern generator and the process of the electron beam writing on the substrate under the control system are also introduced.
介绍了图形发生器的作用及电子束在控制系统作用下在基片上描绘图形的过程。
CLK signal generator with adjustable frequency, gradually changing the frequency of observed changes in scan frequency effect on the output.
CLK采用频率可调信号发生器，逐渐改变频率，观察扫描频率的改变对输出效果的影响。
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