前人关于百合鳞茎淀粉粒变化显微结构的研究多集中于 石蜡切片法和扫描电子显微镜（Scan Electron Microscope，SEM）观察（夏宜平 等，2006；郑慧俊 等， 2006；张月 等，2007）。
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Field Emission Scan Electron Microscope 场发射扫描电镜
scan electron microscope sem 扫描电镜
environmental scan electron microscope 环境扫描电子显微镜
scan transmission electron microscope 扫描透射电子显微镜
Electron Microscope Scan 电子显微镜扫描
The micronized starch granular was analyzed and compared through Scan Electron Microscope.
利用扫描电子显微镜对微细化淀粉的颗粒形貌进行了分析比较。
Two troubles in the operation of S-520 scan electron microscope are analyzed and the related circuits are described. The curing methods are explained in detail.
介绍了S-520型扫描电镜实际操作中出现的两种故障现象。对相关电路进行了简要分析。详细说明了故障的排除方法。
The fatigue fracture surfaces of multiaxial fatigue specimens subjected to proportional and non-proportional multiaxial loadings were observed and analyzed by using the scan electron microscope.
利用扫描电镜对多轴比例和非比例加载下的薄壁管多轴疲劳试样的断口表面进行扫描观测分析。
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