专业释义英英释义
-
扫描链 - 引用次数：23
Because test vectors shift into CUTs and shift out all by scan chain.
扫描测试期间功耗主要来自测试向量移入、移出扫描链时引起的功耗及在扫描测试期间的组合电路部分消耗的功耗。
参考来源 - 集成电路低功耗测试方法研究 -
扫描链 - 引用次数：14
For the test application time can be reduced effectively, this paper proposes an approach based on scan chain disabling technique, in view of incompatible test vector compression method.
为进一步降低测试功耗及测试应用时间，提出一种基于扫描链阻塞技术且针对非相容测试向量的压缩方法。
参考来源 - 一种基于扫描链阻塞技术的低费用测试方法
·2,447,543篇论文数据，部分数据来源于NoteExpress
Scan chain
- abstract: Scan chain is a technique used in design for testing. The objective is to make testing easier by providing a simple way to set and observe every flip-flop in an IC.
以上来源于: WordNet
双语例句
-
The invention discloses a memorizer test device based on a scan chain and a use method thereof.
本发明公开了一种基于扫描链的存储器测试装置及其使用方法。
-
At sometime, just one scan chain or some of the scan chains are active. Average power is reduced.
在某些时刻，仅有一个或者一部分扫描链是活跃的，从而电路的平均功耗和总功耗降低。
-
The invention discloses a scan chain fault diagnosis system, a method and a diagnosis vector generating device.
本发明公开了一种扫描链故障诊断系统、方法及诊断向量生成装置。
应用推荐