它还能加入任何扫描式 (scan-based) 设计流程,并且提供极佳的未知状态容忍能力 (x-state tolerance),工程师不必另外增加逻辑电路或受限于测试结构带来的严苛设
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one-scan based coding 一次性扫描编码
scan based bist 扫描自测试
scan-based test 扫描测试
scan based design 基于扫描设计
line-based scan 逐行扫描
In this thesis, we research on scan-based BIST techniques of digital systems.
本论文对数字系统基于扫描的BIST技术进行了深入研究。
Meanwhile the testing of SOC become more difficult and complex, Boundary-Scan-based Built-in-Test technology give a new solution.
与此同时,片上系统的测试问题也随之产生,基于边界扫描的内建自测试技术为片上系统的测试提供了新的解决方案。
Methods and computer readable media for performing scan-based testing of circuits using one or more test clock control structures are disclosed.
公开了使用一个或多个测试时钟控制结构的来执行基于扫描测试的方法和计算机可读介质。
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