The hardness gradient, depth, microstructure and phases of nitrided layers were measured with Microhardness Apparatus, Microcopy and X-ray diffractometer.
利用显微硬度计、金相显微镜和X射线衍射仪测定了渗氮层的硬度梯度、层深、显微组织和相组成。
The diluting mechanism of organic and inorganic diluents for porcelain clay containing montmorillonite slip have been explored by X-Ray Diffractometer and Transmission Electron Microscope.
本文还利用X -射线衍射仪，透射电镜等测试手段，探讨了有机、无机稀释剂对含蒙脱石瓷砂泥浆的稀释机理。
The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).
使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子力显微镜(afm)对薄膜的结构进行了分析。
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