Aiming at the technology demand of advanced copper interconnection, the effect of pulse current density on cu layer properties such as resistance, crystal size and surface roughness were investigated.
针对先进纳米铜互连技术的要求，研究了脉冲电流密度对铜互连线电阻率、晶粒尺寸和表面粗糙度等性能的影响。
Based on Semiconductor Opening switch (SOS) effect, the SOS can switch off current of great density within nanoseconds, which is applied to pulse power generator of inductive energy storage.
基于SOS效应工作的半导体断路开关可以在纳秒级时间内关断大密度电流，因此可应用于电感储能的脉冲功率发生器。
The effects of pulse peak current density on the texture and hardness of electrodeposited Ni were investigated.
考察了脉冲峰值电流密度对纳米晶镍镀层织构和硬度的影响。
应用推荐