Basing on the study of progressive stress accelerated life test, a rapid evaluation method for electronic device's activation energy is proposed, and the theory model is constructed.

通过对序进应力加速寿命试验的研究，提出了一种快速评价微电子器件失效激活能的方法，建立了计算失效激活能的理论模型。

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Basing on the study of progressive stress accelerated life test, a rapid evaluation method for electronic devices activation energy is proposed, and the theory model is constructed.

通过对序进应力加速寿命试验的研究，提出了一种快速评价半导体器件失效激活能的方法，建立了计算失效激活能的理论模型。

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