... profile irregularity 表面没有平均度 profile microscope 轮廓显微镜 profile projector 轮廓投影仪 ...
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profile measuring microscope 剖面测量显微镜
Two methods of measurement of the refractive index profile in optical fibers: interference microscope method and near field method are evaluated.
对两种测量光纤折射半剖面的方法：干涉显微镜法和近区场法，进行了评价。
The data by dual-microscope is handled and the point height of irregularities and maximum height of the profile are calculated by this tool.
该工具可实现对显微镜读数的处理及微观不平度十点高度和轮廓最大高度的计算。
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