Anisotropically conductive connector, probe material member, wafer inspection apparatus, and wafer inspection method.
各向异性导电连接器,探针元件,和晶片检测仪器及晶片检测方法。
The probe array is placed in the center of the material.
此探针阵列放在材料的中央。
The probe method for measuring the thermal conductivity of multifunction material hollow glassy microsphere is presented.
介绍了一种用探针法测定多功能新材料空心玻璃微球热导率的方法。
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