primary X-ray beam 原X射线束
The intensity of the secondary radiations is weak compared with the intensity of the primary X-ray beam, and some of it, too, may not escape from the material.
这些次级放射线的强度跟原始x射线相比较弱，而且其中的一部分可能留在了那种物质中。
A suggestion was made to measure thin-film thicknesses using second X-ray fluorescence from substrate excited by primary X-ray of plating element, and corresponding equations were derived.
为了弥补目前采用的各种镀层厚度测量方法之不足，本文提出利用镀层元素一次X光激发的基底金属二次荧光进行膜厚测量的设想，并推导出相应的计算公式。
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