primary X-ray beam 原X射线束
The intensity of the secondary radiations is weak compared with the intensity of the primary X-ray beam, and some of it, too, may not escape from the material.
这些次级放射线的强度跟原始x射线相比较弱，而且其中的一部分可能留在了那种物质中。
The presented results also include the relations between scattering factors with therapeutical fields and the distances of primary X-ray source and target plane.
比较的结果还包括均整块和初级准直器的散射与射野大小及离开X射线源距离之间的关系。
A suggestion was made to measure thin-film thicknesses using second X-ray fluorescence from substrate excited by primary X-ray of plating element, and corresponding equations were derived.
为了弥补目前采用的各种镀层厚度测量方法之不足，本文提出利用镀层元素一次X光激发的基底金属二次荧光进行膜厚测量的设想，并推导出相应的计算公式。
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