The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).

使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子力显微镜(afm)对薄膜的结构进行了分析。

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And if we have time today, we'll start in on the photo-electron spectroscopy, if not, that's where we'll start when we come back on Wednesday.

而且如果我们今天还有时间，我们将会开始光电子频谱，如果没有，我们将会在下周三回来时开始。

youdao

And if we have time today, we'll start in on the photo-electron spectroscopy, if not, that's where we'll start when we come back on Wednesday.

而且如果我们今天还有时间，我们将会开始光电子频谱，如果没有,我们将会在下周三回来时开始。

麻省理工公开课 - 化学原理课程节选