The scatter rate of sulphur vacancy in thin film electroluminescent device is calculated through phase shift analysis. The results are compared with other scatter mechanisms.
利用分波法计算了薄膜电致发光器件中硫空位对电子的散射速率，并将其与其它散射机制进行了比较。
With theoretical analysis and numeric calculation, it is found that the transverse nonlinear phase shift caused by the sample can be very well fitted by a Gaussian function.
经过理论分析和数值计算，发现样品对光束横截面上产生的非线性相移非常近似于高斯分布。
The theoretical analysis of its accuracy is presented in the paper and the influence of random noise to phase shift measurement is calculated.
本文对测量精度作了理论分析，计算了随机噪声对相移测量的影响。
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