Detective efficiency is an important instrumental parameter of X ray photoelectron spectrometer.
探测效率是X射线光电子能谱仪一个很重要的仪器参数。
The fundamental parameter method of X-ray fluorescence analysis has many advantages, such as no concentration range limitation of elements, dispensability of standard samples and so on.
本文叙述了利用基本参数法校正源激发合金元素荧光分析的基体效应的基本原理、基体效应的修正方法。
Determining of the surface chromium content on Salvanized Sheet Steel by X ray fluorescence method was introduced, and selected the best determining condition and parameter of the instrument.
本文研究了X -射线荧光法测定镀锌板表面铬层质量的分析方法，实验选择了仪器的最佳测定条件和参数，并对方法的精密度和准确度进行了考查。
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