That will cause overkill and diminish the company’s profit. So at here, I will share my knowledge and research results on probe mark abnormally during the wafer testing process.
在晶圆探针测试当中，常会由于测试环境或是针测机台参数的改变，使得针痕不正常偏移并打出开窗区，造成测试时的误宰,因而造成公司的损失，本文将就晶圆针测中，由于不正常针痕偏移问题探讨进行分析与研究。
参考来源 - 晶圆针测技术之异常问题分析与研究·2,447,543篇论文数据，部分数据来源于NoteExpress
以上来源于: WordNet
N-UNCOUNT You can say that something is overkill when you think that there is more of it than is necessary or appropriate. 过分之举
Such security measures may be overkill.
如此安全措施可能是过分之举。
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