The implementation of automatic generating the optimal test set and fast locating all the faults is also discussed.
文章还阐述了自动产生最佳测试集和快速定位所有故障的具体实施方法。
It is based on a new concept called "Minority Bit", and the fault location test set so obtained is optimal.
它基于“少数位”的概念，所得的故障定位测试集是最佳的。
In this paper, we proposed a method based on the test requirements with mixed international study in this field that it can guarantee generate optimal representative set.
结合国内外几种算法的策略的基础上，提出了一种基于测试需求集的最小测试用例集的生成方法，该方法能够保证得到优化代表集。
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