With the help of optical microscope (OM) and color metallography, the interface migration and its influencing factors were investigated during vacuum holding process.
用光学显微镜和彩色金相技术，研究了真空保温过程中界面的迁移情况及其影响因素。
By using Optical Microscope (OM) and Scanning Electron Microscope (SEM), the structural features of cross section, interior and exterior surfaces for wheat straws were observed and analyzed.
利用光学显微镜(OM)和扫描电镜(SEM)对麦秆横切面、内、外表面的组织结构进行了观察和分析。
The microstructure features at different hot deformation conditions were analyzed with optical microscope (OM) and transmission electron microscope (TEM).
利用光学显微镜（OM）和透射电子显微镜（TEM）观察合金不同热变形条件下的组织形貌特征。
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