The as-obtained products were characterized with scanning electron microscopy (SEM) and X-ray diffraction (XRD).
并分别用扫描电镜和粉末X射线表征其形貌和相结构。
X-ray diffraction and transmission electron micros-copy were used for the characterization of the structure and morphology of the obtained products.
用透射电子显微镜、X射线衍射仪表征样品的形貌和结构。
The obtained products were characterized by X-ray powder diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and scanning electron microscopy (SEM).
合成产物用粉未衍射(XRD)X-射线光电子能谱(XPS)和扫描电子显微(SEM)表征。
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