When some defects are introduced into the periodic photonic crystal, a number of defect modes appear in the stop band.
当在周期性光子晶体中引入多个缺陷时,将在截止带中形成多个缺陷模。
We can also multiply out the expected defects per iteration by the number of remaining iterations and then by the average defect resolution effort.
我们还能够通过余下的迭代的数量和平均的缺陷分辨工作来增加每个迭代的预期缺陷。
The graph in Figure 1, which plots defect density against the number of lines of code under review, supports this rule.
图 1 中的图,描述了缺陷密度与评审代码行数量之间的关系,支持该规则。
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