Nominal capacitance range 标称电容量范围
Finally,mismatch of differential nominal capacitance caused by inevitable manufacturing errors was analyzed and calibrated.
结合考虑不可避免的工艺误差,对差分标称电容的失配进行分析与校准。
参考来源 - 用于微电容检测的C/V电路设计与研究·2,447,543篇论文数据,部分数据来源于NoteExpress
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