Processing time is further decreased by creating multiple scan chains and applying them to multiple pins of the device under test (DUT).
通过产生多个扫描链并将其施加于被测器件(DUT)的多个管脚,可以进一步减少处理时间。
After using compatible compression of multiple scan chains to pretreat the merged test set, modified distance-marking method is used to compress test data.
先采用多扫描链相容压缩预处理总测试集,接着使用改进的距离标记法压缩测试数据。
For multiple index push-downs, multi-index scan is used to combine RIDs from different index scans, then skip-scan on the fact table is performed.
对于多索引下推,多索引扫描用于组合来自不同索引扫描的RID,然后就可以执行对事实表的跳跃式扫描了。
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