Near Field Optical Microscope (NFOM) is a kind of scanning probe microscopy with high resolution.

近场光显微镜(NFOM)是一种高分辩率的扫描探针显微镜。

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Several quantitative drift measurement techniques for scanning probe microscopy (SPM) were introduced. A new method using two-dimensional zero-reference masks was proposed to measure the SPM drift.

对扫描探针显微镜(SPM)仪器漂移的定量测量的几种方法进行探讨，提出应用二维零位标记进行漂移测量。

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Tungsten probe is one of the common probes used in scanning tunnel microscopy (STM).

钨探针是扫描隧道显微镜（STM）常用探针之一。

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