Taking H-800 electron microscope for example, this article introduces some faults appearance, faults analysis and method of faults exclusion.
本文以H - 800型透射电子显微镜为例,介绍了几例故障现象、故障分析及故障排除方法。
Combine the intuition of microscope and fast, accurately, conveniently of laser size instrument, for guaranteeing the reliability of the particle size analysis result is very useful.
将显微镜的直观与激光粒度仪的快速、准确和方便结合起来,对于保证粒度分析结果的可靠性非常有用。
Through appearance analysis and cross-sectional microscope observation, the results indicate that the actual structure has achieved the goal for devised structure.
对试织的样品通过外观分析和横截面显微镜观察,表明实际结构与设计结构相符。
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