The principle of the new microelectronic devices, spin transistor and spin valve transistor is reviewed.
介绍了新型微电子器件自旋晶体管和自旋阀晶体管的工作原理。
The stress is the direct cause to lead to solder balls failure, which causes microelectronic devices damage.
应力是导致焊球失效的直接原因,进而致使器件失效。
This paper describes a fabrication technology of metal tip field emission arrays (FEA) for the vacuum microelectronic devices.
本文介绍了真空微电子器件场发射金属尖阵列阴极的制备工艺技术。
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