The system is made up of five sub-systems of micro - computer measuration, which is controlled with mainframe for management.
该系统由五个微电脑检测系统组成，并用一台系统实施总控管理。
The rapid progress of semi-conductor technology on deep sub-micro and nanometer scale announces the SOC era of IC design.
深亚微米和纳米级的半导体技术迅速进步，使得集成电路的设计已经进入系统集成芯片时代。
With the IC scaling down to deep-sub micro generation, due to the degradation of performance, any conventional device structure is not applicable to IC.
集成电路器件的特征尺寸进入深亚微米时代后，由于微细化和性能方面的影响，一些传统的器件结构将不再适用。
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