The resistance of the metal probe to semiconductor contact can be quite high.
金属探头与半导体接触时的电阻可能相当高。
A method of using metal probe for measuring the void fraction at any point in gas-liquid two-phase flow on Sieve tray is described.
用金属探针法测量塔板上气液两相流中某些点的含气率。
Conclusions Routine use of metal probe for exploration the bile duct may cause injury of common bile duct or the posterior wall of duodenum.
结论常规使用金属胆道探子探查胆道，易导致胆总管下段或十二指肠后壁损伤。
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