... 耐印字擦拭仪马克ing Durability tester 测量显微镜Measurement Microscope 稳压电源Power Supply ...
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depth measurement microscope 深度测量显微镜
microscope type measurement instruments 显微镜式量测设备
Non-destructive measurement by split-beam microscope 分光显微镜的无损测量
It is an objective for nanometer instrument researcher to improve the measurement precision of scanning probe microscope (SPM), the eye and hand of nanometer science and technology.
提高作为纳米科技的“眼”和“手”的扫描探针显微镜(SPM)的测量和定位精度，是纳米仪器界始终追求的目标。
A typical nanostructured titania super hydrophilic film was chosen for general characterization employing a Scanning Probe Microscope (SPM) and an electrochemical measurement system.
选用典型的二氧化钛纳米超亲水薄膜，用扫描探针显微镜(SPM)和电化学测试系统进行一般性的表征。
Tube scanner′s structure errors have great effect on the measurement accuracy of Scanning Probe Microscope(SPM).
单管式扫描器的结构误差是影响扫描探针显微镜测量精度的主要误差因素之一。
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