The principle of memory built-in self-test is analyzed in detail and a typical implementation of MBIST is given in the paper.

文中详细分析了嵌入式存储器内建自测试的实现原理，并给出了存储器内建自测试的一种典型实现。

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Based on an industry project, this paper presents the complete design flow of MBIST and gives the quantitative and qualitative discussion for the test overhead.

根据一个实际项目，本文介绍了MBIST的整体设计过程，并针对测试开销等给出了定量和定性的讨论。

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