Low current measurement applications include capacitor leakage, low current semiconductor, light, and ion beam measurements.
弱电流测量的各种应用包括电容器的漏电、弱电流半导体、光和离子束测量等。
Adding current and voltage sourcing capabilities to a measuring instrument provides an extra degree of versatility for many low level measurement applications.
在测量仪器上附加电流和电压源功能，为各种低电平测量应用提供了额外的灵活性。
For example, in low current and high resistance applications, unguarded cabling can introduce leakage current that will degrade measurement accuracy.
例如，在小电流和高电阻应用中，没有保护线电缆会产生漏泄电流，从而影响测量准确度。
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